Form birefringence of oxidized porous silicon Academic Article uri icon

abstract

  • A network of preferentially oriented pores is shown to induce anisotropy of linear and nonlinear optical properties of oxidized porous silicon (OPS) films. Although the x-ray diffraction indicates the presence of amorphous phase in OPS samples, the near-infrared and visible transmission measurements reveal a strong in-plane anisotropy exceeding that for the crystalline quartz. This anisotropy modifies dramatically polarization properties of the nonlinear optical properties resulting in a strong anisotropy of the third-harmonic signal generated from these films. © 2006 American Institute of Physics.

author list (cited authors)

  • Golovan, L. A., Ivanov, D. A., Melnikov, V. A., Timoshenko, V. Y., Zheltikov, A. M., Kashkarov, P. K., Petrov, G. I., & Yakovlev, V. V.

citation count

  • 15

publication date

  • June 2006