Form birefringence of oxidized porous silicon Academic Article uri icon


  • A network of preferentially oriented pores is shown to induce anisotropy of linear and nonlinear optical properties of oxidized porous silicon (OPS) films. Although the x-ray diffraction indicates the presence of amorphous phase in OPS samples, the near-infrared and visible transmission measurements reveal a strong in-plane anisotropy exceeding that for the crystalline quartz. This anisotropy modifies dramatically polarization properties of the nonlinear optical properties resulting in a strong anisotropy of the third-harmonic signal generated from these films. 2006 American Institute of Physics.

published proceedings


author list (cited authors)

  • Golovan, L. A., Ivanov, D. A., Melnikov, V. A., Timoshenko, V. Y., Zheltikov, A. M., Kashkarov, P. K., Petrov, G. I., & Yakovlev, V. V.

citation count

  • 15

complete list of authors

  • Golovan, LA||Ivanov, DA||Melnikov, VA||Timoshenko, V Yu||Zheltikov, AM||Kashkarov, PK||Petrov, GI||Yakovlev, VV

publication date

  • June 2006