Form birefringence of oxidized porous silicon

abstract

• A network of preferentially oriented pores is shown to induce anisotropy of linear and nonlinear optical properties of oxidized porous silicon (OPS) films. Although the x-ray diffraction indicates the presence of amorphous phase in OPS samples, the near-infrared and visible transmission measurements reveal a strong in-plane anisotropy exceeding that for the crystalline quartz. This anisotropy modifies dramatically polarization properties of the nonlinear optical properties resulting in a strong anisotropy of the third-harmonic signal generated from these films. 2006 American Institute of Physics.

authors

• Yakovlev, Vladislav

published proceedings

• APPLIED PHYSICS LETTERS

author list (cited authors)

• Golovan, L. A., Ivanov, D. A., Melnikov, V. A., Timoshenko, V. Y., Zheltikov, A. M., Kashkarov, P. K., Petrov, G. I., & Yakovlev, V. V.

citation count

• 15

complete list of authors

• Golovan, LA||Ivanov, DA||Melnikov, VA||Timoshenko, V Yu||Zheltikov, AM||Kashkarov, PK||Petrov, GI||Yakovlev, VV

publication date

• June 2006

publisher

• AIP Publishing  Publisher

published in

• Applied Physics Letters  Journal

Digital Object Identifier (DOI)

• 10.1063/1.2212534

start page

• 241113

end page

• 241113

volume

• 88

issue

• 24

URL

• http://dx.doi.org/10.1063/1.2212534