Form birefringence of oxidized porous silicon
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A network of preferentially oriented pores is shown to induce anisotropy of linear and nonlinear optical properties of oxidized porous silicon (OPS) films. Although the x-ray diffraction indicates the presence of amorphous phase in OPS samples, the near-infrared and visible transmission measurements reveal a strong in-plane anisotropy exceeding that for the crystalline quartz. This anisotropy modifies dramatically polarization properties of the nonlinear optical properties resulting in a strong anisotropy of the third-harmonic signal generated from these films. © 2006 American Institute of Physics.
author list (cited authors)
Golovan, L. A., Ivanov, D. A., Melnikov, V. A., Timoshenko, V. Y., Zheltikov, A. M., Kashkarov, P. K., Petrov, G. I., & Yakovlev, V. V.