Towards a visualization of deep neural networks for rough line images
Conference Paper
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Overview
published proceedings
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35th European Mask and Lithography Conference (EMLC 2019)
author list (cited authors)
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Chaudhary, N., & Savari, S. A.
citation count
complete list of authors
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Chaudhary, Narendra||Savari, Serap A
editor list (cited editors)
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Behringer, U. F., & Finders, J. o.
publication date
publisher
published in
Research
keywords
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Deep Learning
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Line Edge Roughness
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Scanning Electron Microscopy
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Stochastics
Identity
Digital Object Identifier (DOI)
Additional Document Info
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URL
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http://dx.doi.org/10.1117/12.2535667