Towards a visualization of deep neural networks for rough line images Conference Paper uri icon

published proceedings

  • 35th European Mask and Lithography Conference (EMLC 2019)

author list (cited authors)

  • Chaudhary, N., & Savari, S. A.

citation count

  • 3

complete list of authors

  • Chaudhary, Narendra||Savari, Serap A

editor list (cited editors)

  • Behringer, U. F., & Finders, J. o.

publication date

  • January 2019

publisher