Transmission electron microscopy study of defects in AlN crystals with rough and smooth surface grains Academic Article uri icon

abstract

  • Defects present in (0 0 0 1) textured polycrystalline AlN grown by the sublimationrecombination method were analyzed using transmission electron microscopy (TEM) methods. Grains in the polycrystalline boule had either a smooth or a rough surface. The rough surface grains had mainly edge dislocations, whereas the smooth surface grains had some sub-grain boundaries and were mostly free of dislocations. Dislocations at the grain boundaries were pinned and could not be annihilated. © 2010 Elsevier B.V. All rights reserved.

author list (cited authors)

  • Nyakiti, L. O., Chaudhuri, J., Gu, Z., & Edgar, J. H.

citation count

  • 4

publication date

  • November 2010