Transmission electron microscopy study of defects in AlN crystals with rough and smooth surface grains Academic Article

abstract

• Defects present in (0 0 0 1) textured polycrystalline AlN grown by the sublimationrecombination method were analyzed using transmission electron microscopy (TEM) methods. Grains in the polycrystalline boule had either a smooth or a rough surface. The rough surface grains had mainly edge dislocations, whereas the smooth surface grains had some sub-grain boundaries and were mostly free of dislocations. Dislocations at the grain boundaries were pinned and could not be annihilated. 2010 Elsevier B.V. All rights reserved.

authors

• Nyakiti, Luke

published proceedings

• JOURNAL OF CRYSTAL GROWTH

author list (cited authors)

• Nyakiti, L. O., Chaudhuri, J., Gu, Z., & Edgar, J. H.

citation count

• 4

complete list of authors

• Nyakiti, LO||Chaudhuri, J||Gu, Z||Edgar, JH

publication date

• January 2010

publisher

• Elsevier  Publisher

published in

• Journal of Crystal Growth  Journal

keywords

• Aluminum Nitride
• Dislocations
• Grain Boundaries
• Polarity
• Sublimation-recombination Crystal Growth
• Transmission Election Microscopy

Digital Object Identifier (DOI)

• 10.1016/j.jcrysgro.2010.09.014

start page

• 3479

end page

• 3484

volume

• 312

issue

• 23

URL

• http://dx.doi.org/10.1016/j.jcrysgro.2010.09.014