Transmission electron microscopy study of defects in AlN crystals with rough and smooth surface grains Academic Article uri icon


  • Defects present in (0 0 0 1) textured polycrystalline AlN grown by the sublimationrecombination method were analyzed using transmission electron microscopy (TEM) methods. Grains in the polycrystalline boule had either a smooth or a rough surface. The rough surface grains had mainly edge dislocations, whereas the smooth surface grains had some sub-grain boundaries and were mostly free of dislocations. Dislocations at the grain boundaries were pinned and could not be annihilated. 2010 Elsevier B.V. All rights reserved.

published proceedings


author list (cited authors)

  • Nyakiti, L. O., Chaudhuri, J., Gu, Z., & Edgar, J. H.

citation count

  • 4

complete list of authors

  • Nyakiti, LO||Chaudhuri, J||Gu, Z||Edgar, JH

publication date

  • January 2010