Chemically resolved interface structure of epitaxial graphene on SiC(0001). Academic Article uri icon

abstract

  • Atomic-layer 2D crystals have unique properties that can be significantly modified through interaction with an underlying support. For epitaxial graphene on SiC(0001), the interface strongly influences the electronic properties of the overlaying graphene. We demonstrate a novel combination of x-ray scattering and spectroscopy for studying the complexities of such a buried interface structure. This approach employs x-ray standing wave-excited photoelectron spectroscopy in conjunction with x-ray reflectivity to produce a highly resolved chemically sensitive atomic profile for the terminal substrate bilayers, interface, and graphene layers along the SiC[0001] direction.

published proceedings

  • Phys Rev Lett

altmetric score

  • 7.864

author list (cited authors)

  • Emery, J. D., Detlefs, B., Karmel, H. J., Nyakiti, L. O., Gaskill, D. K., Hersam, M. C., Zegenhagen, J., & Bedzyk, M. J.

citation count

  • 72

complete list of authors

  • Emery, Jonathan D||Detlefs, Blanka||Karmel, Hunter J||Nyakiti, Luke O||Gaskill, D Kurt||Hersam, Mark C||Zegenhagen, Jörg||Bedzyk, Michael J

publication date

  • November 2013