Stable High-Density FD/SOI SRAM with Selective Back-Gate Bias Using Dual Buried Oxide Conference Paper

name of conference

• 2008 IEEE International SOI Conference

authors

• Nowka, Kevin

published proceedings

• 2008 IEEE INTERNATIONAL SOI CONFERENCE, PROCEEDINGS

author list (cited authors)

• Kim, K., Kuang, J. B., Gebara, F., Ngo, H. C., Chuang, C., & Nowka, K. J.

citation count

• 2

complete list of authors

• Kim, Keunwoo||Kuang, Jente B||Gebara, Fadi||Ngo, Hung C||Chuang, Ching-Te||Nowka, Kevin J

publication date

• October 2008

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE International SOI Conference  Journal

keywords

• 40 Engineering
• 4009 Electronics, Sensors And Digital Hardware

Digital Object Identifier (DOI)

• 10.1109/SOI.2008.4656283

International Standard Book Number (ISBN) 13

• 978-1-4244-1954-8

start page

• 37

end page

• +

URL

• http://dx.doi.org/10.1109/soi.2008.4656283