Hot topic session 9C: Test and fault tolerance for emerging memory technologies Conference Paper

name of conference

• 2014 IEEE 32nd VLSI Test Symposium (VTS)

authors

• Rajendran, Jeyavijayan

published proceedings

• 2014 IEEE 32nd VLSI Test Symposium (VTS)

author list (cited authors)

• Natarajan, S., Majumdar, A., & Rajendran, J.

citation count

• 0

complete list of authors

• Natarajan, Suriya||Majumdar, Amitava||Rajendran, Jeyavijayan

publication date

• May 2014

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

keywords

• 7 Affordable And Clean Energy

Digital Object Identifier (DOI)

• 10.1109/vts.2014.6818788

start page

• 1

end page

• 1

URL

• http://dx.doi.org/10.1109/vts.2014.6818788

user-defined tag

• 7 Affordable and Clean Energy