Characterization of the Reflectivity of Various White Materials Conference Paper uri icon

abstract

  • 2018 SPIE. We present total reflectance measurements and Lambertian characterization of various materials that are commonly (and uncommonly) used as a screen for imaging system calibration (such as flat fielding). We measure the total reflectance of the samples over a broad wavelength range (250 nm < < 2500 nm) that is of interest to astronomical instruments in the ultraviolet, visible, and near-infrared regimes. A Helium-Neon laser was used to determine how closely the various materials' diffuse reflectance characteristics match that of a Lambertian surface.

name of conference

  • Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III

published proceedings

  • ADVANCES IN OPTICAL AND MECHANICAL TECHNOLOGIES FOR TELESCOPES AND INSTRUMENTATION III

author list (cited authors)

  • Schmidt, L. M., Gomez, M., Kim, D., Torregosa, M., Sauseda, M., Prochaska, T., ... Grant, W.

citation count

  • 2

complete list of authors

  • Schmidt, Luke M||Gomez, Madelynn||Kim, Doyeon||Torregosa, Michael||Sauseda, Marcus||Prochaska, Travis||DePoy, DL||Marshall, JL||Gardner, Lawrence||Grant, Walter

editor list (cited editors)

  • Geyl, R., & Navarro, R.

publication date

  • July 2018