Characterization of the Reflectivity of Various White Materials
Conference Paper
Overview
Research
Identity
Additional Document Info
Other
View All
Overview
abstract
2018 SPIE. We present total reflectance measurements and Lambertian characterization of various materials that are commonly (and uncommonly) used as a screen for imaging system calibration (such as flat fielding). We measure the total reflectance of the samples over a broad wavelength range (250 nm < < 2500 nm) that is of interest to astronomical instruments in the ultraviolet, visible, and near-infrared regimes. A Helium-Neon laser was used to determine how closely the various materials' diffuse reflectance characteristics match that of a Lambertian surface.
name of conference
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III