Sub-wavelength microscopy with surface plasmons Conference Paper

abstract

• COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only. An attractive feature of surface plasmons (SPs) is the sub-wavelength characteristics, especially the SPs in two dimensional Dirac systems. In mid-infrared region, the wave vectors of graphene plasmons (GPs) can be two orders larger than that in vacuum, which have potential applications in optical imaging. Here, we propose a scheme that combining the GPs and structured illumination microscopy to realize a nanometer-scale microscopy. This scheme also takes advantage of the other two exciting properties of GPs, i.e., tunability and low loss. The microscopy works in the linear regime and can be used in bioimaging.

name of conference

• Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI

authors

• Zubairy, Muhammad

published proceedings

• STEEP DISPERSION ENGINEERING AND OPTO-ATOMIC PRECISION METROLOGY XI

author list (cited authors)

• Zeng, X., Al-Amri, M., & Zubairy, M. S.

citation count

• 0

complete list of authors

• Zeng, Xiaodong||Al-Amri, M||Zubairy, M Suhail

editor list (cited editors)

• Shahriar, S. M., & Scheuer, J.

publication date

• February 2018

publisher

• SPIE, the international society for optics and photonics  Publisher

published in

• Proceedings of SPIE  Journal

keywords

• Graphene Plasmons
• Structure Illumination Microscopy
• Sub-wavelength Microscopy

Digital Object Identifier (DOI)

• 10.1117/12.2299172

International Standard Book Number (ISBN) 13

• 9781510615816

start page

• 105480n

volume

• 10548

URL

• http://dx.doi.org/10.1117/12.2299172