Measurement of local field effects of the host on the lifetimes of embedded emitters. Academic Article

abstract

• We report experimental results on the variation of the radiative lifetime of Eu3+ ion embedded in a dielectric with the refractive index n. We dope 1 mol % of Eu3+ into the binary glass system xPbO-(1-x)B2O3. By varying x we have achieved a fairly large variation of the refractive index from 1.7 to 2.2. This enables us to study the local field effects for the first time for ions doped in a solid glassy material. Our measurements are in agreement with the so-called real cavity model. The present measurements are free from the complications arising from reorganizational effects in solvents.

authors

• Agarwal, Girish

published proceedings

• Phys Rev Lett

author list (cited authors)

• Manoj Kumar, G., Narayana Rao, D., & Agarwal, G. S.

citation count

• 58

complete list of authors

• Manoj Kumar, G||Narayana Rao, D||Agarwal, GS

publication date

• November 2003

publisher

• American Physical Society (APS)  Publisher

published in

• Physical Review Letters  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering
• 51 Physical Sciences

Digital Object Identifier (DOI)

• 10.1103/PhysRevLett.91.203903

start page

• 203903

volume

• 91

issue

• 20

URL

• http://dx.doi.org/10.1103/physrevlett.91.203903