Measurement of local field effects of the host on the lifetimes of embedded emitters.

We report experimental results on the variation of the radiative lifetime of Eu3+ ion embedded in a dielectric with the refractive index n. We dope 1 mol % of Eu3+ into the binary glass system xPbO-(1-x)B2O3. By varying x we have achieved a fairly large variation of the refractive index from 1.7 to 2.2. This enables us to study the local field effects for the first time for ions doped in a solid glassy material. Our measurements are in agreement with the so-called real cavity model. The present measurements are free from the complications arising from reorganizational effects in solvents.

Measurement of local field effects of the host on the lifetimes of embedded emitters. Academic Article