Investigation of carrier-induced defect behavior in p-type multicrystalline silicon Conference Paper uri icon


  • © 2017 IEEE. Arc faults pose significant reliability and safety issues in today's photovoltaic (PV) systems. This paper presents an effective method based on wavelet transform and support vector machines (SVM) for detection of arc faults in DC PV systems. Because of its advantages in time-frequency signal processing, wavelet transform is applied to extract the characteristic features from system voltage/current signals. SVM is then used to identify arc faults. The performance of the proposed technique is compared with traditional Fourier transform based approaches.

author list (cited authors)

  • Chan, C. E., Fung, T. H., Payne, D., Chen, D., Abbott, M. D., Ciesla, A. M., ... Wenham, S. R.

citation count

  • 1

publication date

  • June 2017