X-ray microbeam investigation of deformation microstructure in microindented Cu Conference Paper uri icon


  • The deformation microstructure under spherical microindents in single crystal Cu has been investigated with submicron spatial resolution using x-ray structural microscopy. A polychromatic, submicron diameter (0.5 m) microbeam was used in combination with micron-resolution depth profiling to make direct, nondestructive measurements of plastic deformation induced lattice rotations under an indent made with a 69 m radius spherical indenter and 200 mN maximum load. Lattice orientations relative to the underformed crystal were determined as a function of position under the indent using differential-aperture x-ray structural microscopy (DAXM). Rotation-axes and misorientation-angles were determined for micron steps along selected microbeam penetration directions.

published proceedings

  • Materials Research Society Symposium - Proceedings

author list (cited authors)

  • Wang, W., Larson, B. C., Pharr, G. M., Ice, G. E., Tischler, J. Z., Budai, J. D., & Liu, W.

complete list of authors

  • Wang, W||Larson, BC||Pharr, GM||Ice, GE||Tischler, JZ||Budai, JD||Liu, W

publication date

  • December 2003