UV Raman Scattering Analysis of Indented and Machined 6H-SiC and -Si 3 N 4 Surfaces Conference Paper uri icon


  • UV Raman scattering is employed as a nondestructive structure sensitive probe to investigate the vibrational properties of the wide bandgap, machined and indented surfaces of 6H-SiC and -Si 3 N 4 . In these materials, the short absorption depth of UV light allows for accurate probing of the surface, and the transparency to visible light allows for analysis of the bulk material. The study on 6H-SiC (0001) included measurements of indentations, and of machined circular (0001) wafer edges. The indentation analysis indicates the response of the material to localized pressures. Machined 6H-SiC wafer edges and machined -Si 3 N 4 surfaces indicate a ductile response and ductile material removal for machining at cutting depths on a nm and m scale. Raman scattering measurements of the ductile surfaces and ductile material removed indicate residual structure changes. The residual surface structures could indicate that a high-pressure phase transformation is the origin of a ductile response on machined brittle materials. 2005 Materials Research Society.

published proceedings

  • Materials Research Society Symposium Proceedings

author list (cited authors)

  • Walter, J., Liang, M., Chen, X. B., Jang, J. I., Bergman, L., Patten, J. A., Pharr, G. M., & Nemanich, R. J.

complete list of authors

  • Walter, JJH||Liang, M||Chen, XB||Jang, JI||Bergman, L||Patten, JA||Pharr, GM||Nemanich, RJ

publication date

  • June 2005