Registration of 16 Sorghum Germplasm Lines
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The sorghum [Sorghum bicolor (L.) Moench] germplasm lines T×2945 through T×2952 and T×2954 through T×2961 (Reg. No. GP-645 to GP-660, PI 655260 to PI 655275) were developed and released by Texas AgriLife Research (formerly the Texas Agricultural Experiment Station), Lubbock, TX, in 2006. These lines are 3-dwarf (dw 1Dw 2dw 3dw 4) in height and possess unique combinations of tan plant color, agronomic traits, traits for resistance to head smut [Sphacelotheca reiliana (Kuhn) Clinton], rust [Puccinia purpurea (Cooke)], zonate leaf spot (Gloeocercospora sorghi Bain and Edgerton), bacterial leaf streak [Xanthomonas holcicola (Elliot) Starr and Burkholder], and bacterial leaf stripe [Pseudomonas andropogoni (E.F. Smith) Stapp], and biotype E greenbug [Schizaphis graminum (Rondani)] resistance. © Crop Science Society of America.
Journal of Plant Registrations
complete list of authors
Peterson, GC||Schaefer, K||Pendleton, BB