The Grain Mold Pathogen, Fusarium thapsinum, Reduces Caryopsis Formation in Sorghum bicolor Academic Article uri icon

abstract

  • AbstractGrain mold is a globally important panicle disease of sorghum [Sorghum bicolor (L.) Moench] that occurs between floral anthesis and physiological maturity of the caryopsis. Many fungi, including Fusarium thapsinum, cause grain mold. In this study, sorghum florets of grain mold resistant (Sureno and Tx2911), moderately resistant (SC170), and susceptible (Tx430) cultivars were sprayinoculated with a high density (1106 microconidia/ml) of F. thapsinum at anthesis. Mean caryopsis formation frequencies [CFF = (total caryopses/total spikelets per panicle)100] for F. thapsinuminoculated Sureno and Tx2911 panicles did not significantly differ from their respective controls, however F. thapsinuminoculated SC170 and Tx430 panicles were significantly less than controls. In addition, CFF was significantly reduced in F. thapsinuminoculated Tx430 panicles when compared to the F. thapsinuminoculated grain mold resistant genotypes (P=0.011). This study suggests that screening of sorghum varieties for caryopsis formation using highdensity inoculations at anthesis would provide an additional assay to measure F. thapsinum resistance in the greenhouse.

published proceedings

  • Journal of Phytopathology

author list (cited authors)

  • Little, C. R., & Magill, C. W.

citation count

  • 13

complete list of authors

  • Little, Christopher R||Magill, Clint W

publication date

  • August 2009

publisher