Strain of MFI crystals in membranes: An in situ synchrotron X-ray study Academic Article

abstract

• Temperature-resolved in situ synchrotron X-ray diffraction is used for the first time to study the microstructure evolution of a preferentially oriented zeolite membrane (siliceous ZSM-5) during calcination of the organic structure directing agent (tetrapropyl ammonium, TPA). Use of transmission sample geometry allowed us to discriminate in-plane from out-of-plane reflections and to calculate strain imposed on the zeolite layer along the in-plane (parallel to the support) as well as the out-of-plane (perpendicular to the support) direction over the entire calcination process. The results strongly suggest that the zeolite crystals of the membrane are under compressive in-plane stress and that their thermal behavior is quite different from free standing powder. 2005 Elsevier Inc. All rights reserved.

authors

• Jeong, Hae-Kwon

published proceedings

• MICROPOROUS AND MESOPOROUS MATERIALS

author list (cited authors)

• Jeong, H. K., Lai, Z. P., Tsapatsis, M., & Hanson, J. C.

citation count

• 38

complete list of authors

• Jeong, HK||Lai, ZP||Tsapatsis, M||Hanson, JC

publication date

• January 2005

publisher

• Elsevier  Publisher

published in

• Microporous and Mesoporous Materials  Journal

keywords

• Crack Formation
• Mfi Zeolite Membrane
• Negative Thermal Expansion
• Thermal Behavior
• Thin Film Stress

Digital Object Identifier (DOI)

• 10.1016/j.micromeso.2005.05.043

start page

• 332

end page

• 337

volume

• 84

issue

• 1-3

URL

• http://dx.doi.org/10.1016/j.micromeso.2005.05.043