Strain of MFI crystals in membranes: An in situ synchrotron X-ray study Academic Article uri icon


  • Temperature-resolved in situ synchrotron X-ray diffraction is used for the first time to study the microstructure evolution of a preferentially oriented zeolite membrane (siliceous ZSM-5) during calcination of the organic structure directing agent (tetrapropyl ammonium, TPA). Use of transmission sample geometry allowed us to discriminate in-plane from out-of-plane reflections and to calculate strain imposed on the zeolite layer along the in-plane (parallel to the support) as well as the out-of-plane (perpendicular to the support) direction over the entire calcination process. The results strongly suggest that the zeolite crystals of the membrane are under compressive in-plane stress and that their thermal behavior is quite different from free standing powder. © 2005 Elsevier Inc. All rights reserved.

author list (cited authors)

  • Jeong, H., Lai, Z., Tsapatsis, M., & Hanson, J. C.

citation count

  • 34

publication date

  • September 2005