Secondary ion emission induced by multicharged 18-keV ion bombardment of solid targets.
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Solid targets of SiO2 CsI, and organic layers of phenylalanine have been bombarded by multicharged Arq+ ions with 1q11. The secondary ion yield has been measured as a function of the incident charge state. No charge-state dependence was observed for most of the atomic and molecular ions, which were identified by time-of-flight mass spectrometry. In contrast, the H+-ion emission is strongly dependent on the incident charge state. 1988 The American Physical Society.
author list (cited authors)
Della-Negra, S., Depauw, J., Joret, H., Le Beyec Y, .., & Schweikert, E. A.
complete list of authors
Della-Negra, S||Depauw, J||Joret, H||Schweikert, EA