HIGH ENERGY HEAVY-ION INDUCED X-RAY EMISSION ANALYSIS.
Academic Article
Overview
Additional Document Info
View All
Overview
abstract
X-ray and background trends from high energy ion bombardment were investigated using 0. 5 MeV/amu and 1. 0 MeV/amu O**n** plus , Ar**n** plus , Kr**n** plus and Xe**n** plus beams. A method for optimization of the projectile size and energy to achieve maximum measurement sensitivity is given, based upon an observed enhancement in X-ray production when the K or L shell binding energy of the projectile approximately matches the K or L shell binding energy of the target. Experimental detection sensitivities of 0. 8-10 ppm were obtained for the elements Mn to Se in biological samples with a 1 MeV/amu Kr**7** plus beam of 70 nA for 1000 s. Considering the amount of sample assayed in this work (about 15 mu g), HEHIX is truly a trace analysis technique applicable on microsamples.
