Thermal annealing behavior of hydrogen and surface topography of H2+ ion implanted tungsten Academic Article uri icon

abstract

  • 2018 Atomic Energy Society of Japan. All rights reserved. Tungsten (W) has been proposed as a plasma-facing material in fusion reactors due to its outstanding properties. Degradation of the material properties is expected to occur as a result of hydrogen (H) isotope permeation and trapping in W. In this study, two polycrystalline W plates were implanted with 80 keV H2+ ions to a fluence of 2 1021 H+/m2 at room temperature (RT). Time-of-flight secondary ion mass spectrometry (ToF-SIMS), focused ion beam (FIB), and scanning electron microscopy (SEM) were used for sample characterization. The SIMS data shows that H atoms are distributed well beyond the ion projected range. Isochronal annealing appears to suggest two H release stages that might be associated with the reported activation energies. H release at RT was observed between days 10 and 70 following ion implantation, and the level was maintained over the next 60days. In addition, FIB/SEM results exhibit H2 blister formation near the surface of the as-implanted W. The blister distribution remains unchanged after thermal annealing up to 600 C.

published proceedings

  • JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY

author list (cited authors)

  • Zhang, J., Jiang, W., Zhu, Z., Shao, L., Price, L., Zhao, J., & Wang, T.

citation count

  • 5

complete list of authors

  • Zhang, Jiandong||Jiang, Weilin||Zhu, Zihua||Shao, Lin||Price, Lloyd||Zhao, Jiangtao||Wang, Tieshan

publication date

  • July 2018