Yield variation among closely-related wheat lines under water stress is related to root length. Conference Paper uri icon

published proceedings


author list (cited authors)

  • Lazar, M. D., Piccinni, G., Xue, Q., Wang, W. C., Salisbury, C. D., & Saulescu, N. N.

complete list of authors

  • Lazar, MD||Piccinni, G||Xue, Q||Wang, WC||Salisbury, CD||Saulescu, NN

publication date

  • January 1997