Guard-Ring Dependence of Noise Characteristics for Single-Photon Avalanche Diodes in a Standard CMOS Technology Conference Paper

abstract

• 2017 IEEE. We investigate the effects of guard-ring structure on noise characteristics for CMOS-compatible single-photon avalanche diodes (SPADs). SPADs with different guard-ring structures are fabricated in standard 0.18-m CMOS technology and the noise characteristics as dark current, dark-count rate and afterpulsing probability are measured and analyzed.

name of conference

• 2017 IEEE 14th International Conference on Group IV Photonics (GFP)

authors

• Palermo, Samuel

published proceedings

• 2017 IEEE 14th International Conference on Group IV Photonics (GFP)

author list (cited authors)

• Rhim, J., Yu, K., Chang, P., Palermo, S., Li, C., Fiorentino, M., Beausoleil, R., & Lee, M.

citation count

• 4

complete list of authors

• Rhim, Jinsoo||Yu, Kunzhi||Chang, Po-Hsuan||Palermo, Samuel||Li, Cheng||Fiorentino, Marco||Beausoleil, Raymond||Lee, Myung-Jae

publication date

• January 2017

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/group4.2017.8082243

International Standard Book Number (ISBN) 13

• 9781509065684

start page

• 155

end page

• 156

URL

• http://dx.doi.org/10.1109/group4.2017.8082243