Guard-Ring Dependence of Noise Characteristics for Single-Photon Avalanche Diodes in a Standard CMOS Technology
Additional Document Info
2017 IEEE. We investigate the effects of guard-ring structure on noise characteristics for CMOS-compatible single-photon avalanche diodes (SPADs). SPADs with different guard-ring structures are fabricated in standard 0.18-m CMOS technology and the noise characteristics as dark current, dark-count rate and afterpulsing probability are measured and analyzed.
name of conference
2017 IEEE 14th International Conference on Group IV Photonics (GFP)