A self-repairable threshold cellular array Academic Article

abstract

• The concept of cellular organization has been found to be very important in the design of large-scale integrated (LSI) digital systems. A cellular array is described where each cell contains a threshold gate. This array can be used to realize any Boolean function. Two tests are sufficient to test the entire array for faults. An extension of the principle is described. It deals with the design of an array where a faulty cascade, if there be any, is automatically by-passed and an identical fault-free cascade is introduced into the array.

authors

• Sen, Arun

published proceedings

• International Journal of Electronics

author list (cited authors)

• SEN, A., BANDYOPADHYAY, S., DE, P., SARMA, D., & CHOUDHURY, A. K.

citation count

• 0

complete list of authors

• SEN, A||BANDYOPADHYAY, S||DE, P||SARMA, D||CHOUDHURY, AK

publication date

• January 1974

publisher

• Taylor & Francis  Publisher

published in

• International Journal of Electronics  Journal

Digital Object Identifier (DOI)

• 10.1080/00207217408900584

start page

• 727

end page

• 736

volume

• 37

issue

• 6

URL

• http://dx.doi.org/10.1080/00207217408900584