Microstructure-mechanical properties correlation in irradiated amorphous SiOC Academic Article

abstract

• 2017 Elsevier Ltd The microstructure and mechanical properties of amorphous silicon oxycarbide (SiOC) before and after irradiation were investigated using Fourier-transform infrared spectroscopy (FTIR), transmission electron microscopy (TEM), Rutherford backscattering spectrometry (RBS), nuclear reaction analysis and nano-indentation. SiOC films of different compositions were subjected 1 displacement per atom (dpa) He + irradiation. The irradiation results in a decrease of SiOSi bond angle and an increase of average coordination number. These microstructure variations are associated with increases of hardness and Young's modulus. Our findings reveal that mechanical properties correlate with the SiOSi bond angle and average coordination number in irradiated amorphous SiOC alloys.

authors

• Nastasi, Michael
• Shao, Lin

published proceedings

• SCRIPTA MATERIALIA

author list (cited authors)

• Su, Q., King, S., Li, L., Wang, T., Gigax, J., Shao, L., Lanford, W. A., & Nastasi, M.

citation count

• 22

complete list of authors

• Su, Qing||King, Sean||Li, Liyi||Wang, Tianyao||Gigax, Jonathan||Shao, Lin||Lanford, William A||Nastasi, Michael

publication date

• March 2018

publisher

• Elsevier  Publisher

published in

• Scripta Materialia  Journal

keywords

• Amorphous Silicon Oxycarbide
• FTIR
• Microstructure-property Correlation
• Radiation Tolerant Materials

Digital Object Identifier (DOI)

• 10.1016/j.scriptamat.2017.11.053

start page

• 316

end page

• 320

volume

• 146

URL

• http://dx.doi.org/10.1016/j.scriptamat.2017.11.053