Model-based product quantity control Conference Paper

abstract

• A methodology for building Response Surface Models (RSM) for product quantity control of integrated circuits is presented. A simulation based approach is used to build the models. The work focuses on controlling the number of wafer starts devoted to each product based on in-line, in-situ and Wafer-level Electric Tests (WET). Real-time decisions are made depending on the demand for a particular performance bin.

name of conference

• Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'

authors

• Walker, Duncan

published proceedings

• SEVENTEENTH IEEE/CPMT INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY SYMPOSIUM: MANUFACTURING TECHNOLOGIES - PRESENT AND FUTURE

author list (cited authors)

• Ramakrishnan, V., & Walker, D.

citation count

• 3

complete list of authors

• Ramakrishnan, V||Walker, DMH

publication date

• January 1995

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

keywords

• 40 Engineering
• 4010 Engineering Practice And Education

Digital Object Identifier (DOI)

• 10.1109/IEMT.1995.526192

International Standard Book Number (ISBN) 10

• 0-7803-2996-1

start page

• 389

end page

• 395

URL

• http://dx.doi.org/10.1109/iemt.1995.526192