Model-based product quantity control Conference Paper uri icon

abstract

  • A methodology for building Response Surface Models (RSM) for product quantity control of integrated circuits is presented. A simulation based approach is used to build the models. The work focuses on controlling the number of wafer starts devoted to each product based on in-line, in-situ and Wafer-level Electric Tests (WET). Real-time decisions are made depending on the demand for a particular performance bin.

published proceedings

  • Proceedings of the IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium

author list (cited authors)

  • Ramakrishnan, V., & Walker, D.

complete list of authors

  • Ramakrishnan, V||Walker, DMH

publication date

  • December 1995