Neighbor current ratio (NCR): A new metric for I-DDQ data analysis Conference Paper

abstract

• 2002 IEEE. IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault free currents. The concept of current ratios, in which the ratio of maximum to minimum IDDQ is used to screen faulty chips, has been previously proposed. The neighboring chips on a wafer have similar fault free properties and are correlated. In this paper, the use of spatial correlation in combination with current ratios is investigated. By differentiating chips based on their nonconformance to local IDDQ variation, outliers are identified. The analysis of SEMATECH data is presented.

name of conference

• 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.

authors

• Walker, Duncan

published proceedings

• 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS

author list (cited authors)

• Sabade, S. S., & Walker, D.

citation count

• 18

complete list of authors

• Sabade, SS||Walker, DMH

publication date

• January 2002

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems  Journal

keywords

• Current Ratios
• I-ddq Testing
• Spatial Correlation

Digital Object Identifier (DOI)

• 10.1109/DFTVS.2002.1173535

International Standard Book Number (ISBN) 10

• 0-7695-1831-1

start page

• 381

end page

• 389

volume

• 2002-January

URL

• http://dx.doi.org/10.1109/dftvs.2002.1173535