An L2 error test with order selection and thresholding
Academic Article
-
- Overview
-
- Research
-
- Identity
-
- Additional Document Info
-
- View All
-
Overview
author list (cited authors)
citation count
complete list of authors
-
Lee, GeungHee||Hart, Jeffrey D
publication date
publisher
published in
Research
keywords
-
Aic Type Criterion
-
Fourier Series Estimator
-
L-2 Error Test
-
Neyman Smooth Test
-
Portmanteau Test
-
Thresholding Test
Identity
Digital Object Identifier (DOI)
Additional Document Info
start page
end page
volume
issue