Effect of wheat kernel size and orientation on reflectance spectra and single kernel color classification Conference Paper uri icon

abstract

  • An optical radiation measurement system, which measured reflectance spectra from 400 to 2000 nm, was used to determine the effect of wheat kernel size and orientation on visible and near-infrared reflectance spectral measurement. The results show that wheat kernel size and orientation had a significant effect on the spectra. Mathematical methods can be used to reduce the effect of kernel size and orientation on the spectra. The effect of kernel size and orientation on single wheat kernel color classification was tested.

published proceedings

  • Paper - American Society of Agricultural Engineers

author list (cited authors)

  • Wang, D., Dowell, F. E., & Lacey, R. E

complete list of authors

  • Wang, D||Dowell, FE||Lacey, RE

publication date

  • December 1997