Analysis of Anodic Oxide Films on Niobium Academic Article

abstract

• Anodic oxide films were grown on niobium in the presence of sodium tungstate. Two sample sets were grown at varying temperatures, and one set was grown to varying terminal voltages. The resulting films were examined by X-ray photoelectron spectroscopy (XPS) and Rutherford backscattering spectrometry (RBS). The XPS results show a close association of the sodium and tungstate species at the surface. Depth profiling shows the reduction of niobium oxide and the steady decrease in the amount of incorporated sodium with increased depth. The RBS data show multiple, overlapping peaks in the tungsten region. The layered structure is voltage dependent. 1989, American Chemical Society. All rights reserved.

authors

• Schweikert, Emile

published proceedings

• CHEMISTRY OF MATERIALS

author list (cited authors)

• Magnussen, N., Quinones, L., Dufner, D. C., Cocke, D. L., Schweikert, E. A., Patnaik, B. K., Barros, L., & Baptista, G. B.

citation count

• 11

complete list of authors

• Magnussen, N||Quinones, L||Dufner, DC||Cocke, DL||Schweikert, EA||Patnaik, BK||Barros, Leite CV||Baptista, GB

publication date

• March 1989

publisher

• American Chemical Society (ACS)  Publisher

published in

• CHEMISTRY OF MATERIALS  Journal

Digital Object Identifier (DOI)

• 10.1021/cm00002a011

start page

• 220

end page

• 225

volume

• 1

issue

• 2

URL

• http://dx.doi.org/10.1021/cm00002a011