An evaluation of coincidental secondary ion emission from keV mono- and polyatomic projectile impacts Conference Paper uri icon

abstract

  • Coincidental secondary ion emission yields were analyzed as a function of projectile characteristics. The efficient application of coincidental ion mass spectrometry (CIMS) required selection of a projectile maximizing coincidental SI emission. The projectiles were produced with fission fragments from a 252Cf source striking an aluminized mylar foil coated with a vapor deposited layer of CsI. The ions desorbed off the CsI were accelerated, mass-separated, and detected in a second time of flight (TOF) analyzer. Enhanced SI yields were obtained with polyatomic keV projectiles.

published proceedings

  • Proceedings 50th ASMS Conference on Mass Spectrometry and Allied Topics

author list (cited authors)

  • Rickman, R. D., Hager, G. J., Verkhoturov, S. V., & Schweikert, E. A.

complete list of authors

  • Rickman, RD||Hager, GJ||Verkhoturov, SV||Schweikert, EA

publication date

  • December 2002