Coincidence measurements in mass spectrometry Academic Article uri icon

abstract

  • The detection of coincidental emissions (electron-ion, ion-ion, photon-ion) can enhance the amount of information available in desorption time-of-flight mass spectrometry (TOF-MS) by identifying physical, chemical and/or spatial correlations. This paper outlines the conditions for coincidence measurements and the methodology for identifying correlations. Applications of coincidence-correlation mass spectrometry include the study of the composition and structure of polyatomic ions, the process involved in ion production from solids and the chemical microhomogeneity of surfaces.

published proceedings

  • Journal of Mass Spectrometry

author list (cited authors)

  • Van Stipdonk, M. J., Schweikert, E. A., & Park, M. A.

citation count

  • 19

complete list of authors

  • Van Stipdonk, MJ||Schweikert, EA||Park, MA

publication date

  • November 1997

publisher