Coincidence measurements in mass spectrometry
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abstract
The detection of coincidental emissions (electron-ion, ion-ion, photon-ion) can enhance the amount of information available in desorption time-of-flight mass spectrometry (TOF-MS) by identifying physical, chemical and/or spatial correlations. This paper outlines the conditions for coincidence measurements and the methodology for identifying correlations. Applications of coincidence-correlation mass spectrometry include the study of the composition and structure of polyatomic ions, the process involved in ion production from solids and the chemical microhomogeneity of surfaces.