Raman microprobe analysis of elastic strain and fracture in electrophoretically deposited CdSe nanocrystal films. Academic Article

abstract

• The mechanical stability of nanocrystal films is critical for applications, yet largely unexplored. Raman microprobe analysis used here to probe the nanocrystal cores of thick, fractured electrophoretically deposited films of 3.2 nm diameter CdSe nanocrystals measures approximately 2.5% in-plane tensile strain in cores of unfractured films. The crack dimensions determine the overall in-plane film strain, approximately 11.7%, and the film biaxial modulus, approximately 13.8 GPa, from which the biaxial modulus of the trioctylphosphine oxide ligand matrix is inferred, approximately 5.1 GPa.

authors

• Banerjee, Sarbajit

published proceedings

• Nano Lett

altmetric score

• 3

author list (cited authors)

• Banerjee, S., Jia, S., Kim, D. I., Robinson, R. D., Kysar, J. W., Bevk, J., & Herman, I. P.

citation count

• 32

complete list of authors

• Banerjee, Sarbajit||Jia, Shengguo||Kim, Dae I||Robinson, Richard D||Kysar, Jeffrey W||Bevk, Joze||Herman, Irving P

publication date

• February 2006

publisher

• American Chemical Society (ACS)  Publisher

published in

• Nano Letters  Journal

keywords

• Cadmium Compounds
• Electrophoresis
• Membranes, Artificial
• Nanostructures
• Particle Size
• Selenium Compounds
• Sensitivity And Specificity
• Spectrum Analysis, Raman
• Surface Properties

PubMed Central ID

• 16464030

Digital Object Identifier (DOI)

• 10.1021/nl051921g

start page

• 175

end page

• 180

volume

• 6

issue

• 2

URL

• http://dx.doi.org/10.1021/nl051921g