DEVELOPMENT OF A SECOND GENERATION OF PLASTICIZED SULFUR (SULPHLEX) BINDER.

Two second-generation plasticized sulfur formulations were identified as possessing low-temperature engineering properties that are much improved over the first-generation formulations. The J-integral, a measure of the energy required to induce crack growth, was found to be an excellent and sensitive parameter by which to evaluate the low-temperature fracture susceptibility of the plasticized sulfur binders. A strong relationship was found between the critical energy required to indicate crack growth, J//I//C, and the glass transition temperature of the plasticized sulfur binders. The second-generation binders presented are evaluated based on creep compliance, controlled stress and controlled displacement fatigue, glass transition temperature, and the J//I//C.

DEVELOPMENT OF A SECOND GENERATION OF PLASTICIZED SULFUR (SULPHLEX) BINDER. Academic Article