Low vacuum scanning electron microscopy, a novel technique for integrated microscopic evaluation of implantable devices
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published proceedings
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Microscopy and Microanalysis
author list (cited authors)
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Clubb, F. J., Coscio, M. R., Nichols, R., Rossi, A., Stagnoli, L., Sedlik, S., ... McClay, C. B.
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Clubb, FJ||Coscio, MR||Nichols, R||Rossi, A||Stagnoli, L||Sedlik, S||Koullick, E||Bergan, M||Fogt, E||Petersen, M||McClay, CB
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