Temperature effects of Si interface passivation layer deposition on high-k III-V metal-oxide-semiconductor characteristics Academic Article uri icon

author list (cited authors)

  • Ok, I., Kim, H., Zhang, M., Zhu, F., Park, S., Yum, J., Zhao, H., & Lee, J. C.

citation count

  • 15

complete list of authors

  • Ok, InJo||Kim, H||Zhang, M||Zhu, F||Park, S||Yum, J||Zhao, H||Lee, Jack C

publication date

  • September 2007