Temperature effects of Si interface passivation layer deposition on high-k III-V metal-oxide-semiconductor characteristics
Academic Article
-
- Overview
-
- Identity
-
- Additional Document Info
-
- Other
-
- View All
-
Overview
author list (cited authors)
-
Ok, I., Kim, H., Zhang, M., Zhu, F., Park, S., Yum, J., Zhao, H., & Lee, J. C.
citation count
complete list of authors
-
Ok, InJo||Kim, H||Zhang, M||Zhu, F||Park, S||Yum, J||Zhao, H||Lee, Jack C
publication date
publisher
published in
Identity
Digital Object Identifier (DOI)
Additional Document Info
start page
end page
volume
issue
Other
URL
-
http://dx.doi.org/10.1063/1.2790780