Flatband voltage instability characteristics of HfO2-based GaAs metal-oxide-semiconductor capacitors with a thin Ge layer Academic Article uri icon

author list (cited authors)

  • Kim, H., Ok, I., Zhang, M., Zhu, F., Park, S., Yum, J., ... Majhi, P.

citation count

  • 9

complete list of authors

  • Kim, Hyoung-Sub||Ok, I||Zhang, M||Zhu, F||Park, S||Yum, J||Zhao, H||Lee, Jack C||Oh, Jungwoo||Majhi, Prashant

publication date

  • March 2008