A displacement measurement technique using millimeter-wave interferometry Academic Article

abstract

• A displacement measurement sensor, capable of sub-millimeter resolution, using millimeter-wave interferometry has been developed. The sensor operates at 37.6 GHz and is realized using both microwave integrated circuits and monolithic microwave integrated circuits. It has been used to accurately measure the displacement of metal plate location and water level. A resolution of only 0.05 mm is achieved. A maximum error of 0.3 mm is also attained without correction for the nonlinearity of the phase-detection processor and agrees well with the theoretical calculation.

authors

• Nguyen, Cam Van

published proceedings

• IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES

altmetric score

• 3

author list (cited authors)

• Kim, S., & Nguyen, C.

citation count

• 79

complete list of authors

• Kim, S||Nguyen, C

publication date

• June 2003

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Transactions on Microwave Theory and Techniques  Journal

keywords

• Displacement Measurement
• Microwave Interferometer
• Millimeter-wave Interferometer
• Sensor

Digital Object Identifier (DOI)

• 10.1109/TMTT.2003.812575

start page

• 1724

end page

• 1728

volume

• 51

issue

• 6

URL

• http://dx.doi.org/10.1109/tmtt.2003.812575