Fault behavior dictionary for simulation of device-level transients Conference Paper

abstract

• This paper presents a methodology for the simulation of massive number of device-level transient faults. Fault injection locations and the gates around those locations are extracted and evaluated with SPICE. The extracted sub-circuits are exercised exhaustively while fault-injections are performed. Faulty behavior at the outputs of each sub-circuit is recorded in a dictionary, along with the associated input vector, fault-injection time, and location. The recorded logical errors are injected concurrently at run-time on the target design. A concurrent transient simulator is developed to allow simultaneous evaluation of a massive number of fault-injections, in a single simulation pass. The methodology is illustrated by a case study of MC68000 microprocessor.

name of conference

• Proceedings of 1993 International Conference on Computer Aided Design (ICCAD)

authors

• Choi, Gwan

published proceedings

• Proceedings of 1993 International Conference on Computer Aided Design (ICCAD)

author list (cited authors)

• Choi, G. S., Iyer, R. K., & Saab, D. G.

citation count

• 17

complete list of authors

• Choi, GS||Iyer, RK||Saab, DG

publication date

• January 1993

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/iccad.1993.580023

International Standard Book Number (ISBN) 10

• 0818644923

start page

• 6

end page

• 9

URL

• http://dx.doi.org/10.1109/iccad.1993.580023