Scanning probe lithography tips with spring-on-tip designs: Analysis, fabrication, and testing
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This letter reports a special tip design for probes used in scanning probe lithography applications. The sidewalls of the pyramidal tip located at the distal end of a cantilever probe are modified to contain folded spring structures to reduce the overall force constant of the scanning probe. The spring structure is generated using focused ion beam milling method. We have conducted finite element simulation of the force constants of such folded springs under various geometries. We also demonstrated sub-100 nm scanning probe lithography using a modified spring tip in the dip pen nanolithography writing mode. © 2005 American Institute of Physics.
author list (cited authors)
Wang, X., Vincent, L., Bullen, D., Zou, J., & Liu, C.