Distribution High Impedance Fault Location Using Localized Voltage Magnitude Measurements Conference Paper uri icon

abstract

  • 2014 IEEE. The detection and location of high impedance faults has historically been a difficult endeavor due to the low currents produced. However, the recent advent of distributed voltage monitoring devices, enabling access to fast-sampled, expansive voltage measurements throughout a distribution network, can ease this task. This paper considers the potential to use these distribution level devices to detect and locate such faults. A simulation-based method is proposed that compares a measured voltage profile, obtained from the devices, and simulated voltage profiles at various locations using a power system simulation software. The simulation locations are intelligently selected using the Golden section search and possible fault impedance values are iterated through for each location. The L1-norm is used to compare the two profiles, with the lowest error norm representing the best match - the most likely fault location and impedance.

name of conference

  • 2014 North American Power Symposium (NAPS)

published proceedings

  • 2014 North American Power Symposium (NAPS)

author list (cited authors)

  • Hossain, S., Zhu, H., & Overbye, T.

citation count

  • 8

complete list of authors

  • Hossain, Shamina||Zhu, Hao||Overbye, Thomas

publication date

  • January 2014