Nanoscale IR spectroscopy of polymer systems using an atomic force microscope Conference Paper uri icon

abstract

  • We describe a lab based AFM based IR measurement capability that can obtain local spectra and IR maps over the spectral range of 1000-4000cm-1with spatial resolution as high as 100nm. We demonstrate this new capability on a polymer multilayer.

published proceedings

  • Annual Technical Conference - ANTEC, Conference Proceedings

author list (cited authors)

  • Meyers, G., Reinhardt, C., Felts, J. R., King, W. P., Prater, C. B., Cook, D., & Kjoller, K.

complete list of authors

  • Meyers, G||Reinhardt, C||Felts, JR||King, WP||Prater, CB||Cook, D||Kjoller, K

publication date

  • September 2010