HEATED ATOMIC FORCE MICROSCOPE CANTILEVERS WITH WEAR-RESISTANT ULTRANANOCRYSTALLINE DIAMOND TIPS Conference Paper uri icon

abstract

  • We report a wear-resistant ultrananocrystalline diamond (UNCD) tip integrated onto a heated atomic force microscope (AFM) cantilever. The batch-fabricated UNCD tips have tip radii of about 10 nm and heights up to 7 m. The tips were wear-resistant throughout 1.2 m of scanning over a silicon grating at a force of 200 nN and a speed of 10 m/s. Under the same conditions, a silicon tip was completely destroyed. When used for thermal imaging, the UNCD tip heated cantilever has a vertical imaging resolution of 1.9 nm. Finally, we demonstrate thermal nanolithography of hundreds of nano structures of polyethylene. 2013 IEEE.

name of conference

  • 2013 IEEE 26th International Conference on Micro Electro Mechanical Systems (MEMS)

published proceedings

  • 26TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS (MEMS 2013)

author list (cited authors)

  • Kim, H. J., Moldovan, N., Felts, J. R., Somnath, S., Dai, Z., Jacobs, T., ... King, W. P.

citation count

  • 1

complete list of authors

  • Kim, HJ||Moldovan, N||Felts, JR||Somnath, S||Dai, Z||Jacobs, TDB||Carpick, RW||Carlisle, JA||King, WP

publication date

  • January 2013