Near-field infrared absorption of plasmonic semiconductor microparticles studied using atomic force microscope infrared spectroscopy Academic Article

abstract

• We report measurements of near-field absorption in heavily silicon-doped indium arsenide microparticles using atomic force microscope infrared spectroscopy (AFM-IR). The microparticles exhibit an infrared absorption peak at 5.75 m, which corresponds to a localized surface plasmon resonance within the microparticles. The near-field absorption measurements agree with far-field measurements of transmission and reflection, and with results of numerical solutions of Maxwell equations. AFM-IR measurements of a single microparticle show the temperature increase expected from Ohmic heating within the particle, highlighting the potential for high resolution infrared imaging of plasmonic and metamaterial structures. 2013 AIP Publishing LLC.

authors

• Felts, Jonathan

published proceedings

• APPLIED PHYSICS LETTERS

altmetric score

• 10

author list (cited authors)

• Felts, J. R., Law, S., Roberts, C. M., Podolskiy, V., Wasserman, D. M., & King, W. P.

citation count

• 25

complete list of authors

• Felts, Jonathan R||Law, Stephanie||Roberts, Christopher M||Podolskiy, Viktor||Wasserman, Daniel M||King, William P

publication date

• January 2013

publisher

• AIP Publishing  Publisher

published in

• Applied Physics Letters  Journal

Digital Object Identifier (DOI)

• 10.1063/1.4802211

start page

• 152110

end page

• 152110

volume

• 102

issue

• 15

URL

• http://dx.doi.org/10.1063/1.4802211