Near-field infrared absorption of plasmonic semiconductor microparticles studied using atomic force microscope infrared spectroscopy
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We report measurements of near-field absorption in heavily silicon-doped indium arsenide microparticles using atomic force microscope infrared spectroscopy (AFM-IR). The microparticles exhibit an infrared absorption peak at 5.75 m, which corresponds to a localized surface plasmon resonance within the microparticles. The near-field absorption measurements agree with far-field measurements of transmission and reflection, and with results of numerical solutions of Maxwell equations. AFM-IR measurements of a single microparticle show the temperature increase expected from Ohmic heating within the particle, highlighting the potential for high resolution infrared imaging of plasmonic and metamaterial structures. 2013 AIP Publishing LLC.
author list (cited authors)
Felts, J. R., Law, S., Roberts, C. M., Podolskiy, V., Wasserman, D. M., & King, W. P.
complete list of authors
Felts, Jonathan R||Law, Stephanie||Roberts, Christopher M||Podolskiy, Viktor||Wasserman, Daniel M||King, William P