Near-field infrared absorption of plasmonic semiconductor microparticles studied using atomic force microscope infrared spectroscopy Academic Article uri icon

abstract

  • We report measurements of near-field absorption in heavily silicon-doped indium arsenide microparticles using atomic force microscope infrared spectroscopy (AFM-IR). The microparticles exhibit an infrared absorption peak at 5.75 μm, which corresponds to a localized surface plasmon resonance within the microparticles. The near-field absorption measurements agree with far-field measurements of transmission and reflection, and with results of numerical solutions of Maxwell equations. AFM-IR measurements of a single microparticle show the temperature increase expected from Ohmic heating within the particle, highlighting the potential for high resolution infrared imaging of plasmonic and metamaterial structures. © 2013 AIP Publishing LLC.

altmetric score

  • 10

author list (cited authors)

  • Felts, J. R., Law, S., Roberts, C. M., Podolskiy, V., Wasserman, D. M., & King, W. P.

citation count

  • 20

publication date

  • April 2013