Evaporated cadmium telluride films on steel foil substrates

abstract

• Adherent CdTe films were vacuum-evaporated on steel foil substrates heated to between 240 C and 320 C. As-deposited films were p-type and had a preferred (111) orientation with an average grain size of 0.6 m. To control the electrical properties of the films, gold or tellurium interlayers were deposited between the steel and the CdTe. A tellurium interlayer caused larger as-deposited grains than either the gold or bare steel. Annealing of CdTe films at 550 C increased the grain size and tended to transform p-type CdTe into n-type. X-ray fluorescence analysis indicated that annealing had caused iron to diffuse into the CdTe, which may have caused the type reversion. 1995 Chapman & Hall.

authors

• Singh, Vijay

published proceedings

• Journal of Materials Science: Materials in Electronics

author list (cited authors)

• Chavez, H., Santiesteban, R., Mcclure, J. C., & Singh, V. P.

citation count

• 6

complete list of authors

• Chavez, H||Santiesteban, R||Mcclure, JC||Singh, VP

publication date

• February 1995

publisher

• Springer Nature  Publisher

published in

• Journal of Materials Science: Materials in Electronics  Journal

Digital Object Identifier (DOI)

• 10.1007/bf00208129

start page

• 21

end page

• 24

volume

• 6

issue

• 1

URL

• http://dx.doi.org/10.1007/bf00208129