The effect of atomic force microscope probe size on indentation tests simulated using realistic surface forces
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The effects of the size and shape of an indenter tip used in a nanoscale indentation test (such as with an atomic force microscope) are studied using realistic, finite-range surface forces to describe the contact and extended-range interaction of the indenter and sample. Sphero-conical indenters with tips ranging from sharp-pointed to very rounded tips (similar to spherical tips) are studied. A continuum Lennard-Jones adhesion potential and a Poisson-Boltzmann exponential repulsion law are used to study adhesive and repulsive-only interactions, respectively. The size of the tip affects the qualitative response for an adhesive surface force potential, with increasingly rounded tips exhibiting a more pronounced jump into contact and a greater overall adhesion. The effects of tip size are less pronounced for pure repulsion. Copyright 2010 Inderscience Enterprises Ltd.
International Journal of Materials and Structural Integrity
author list (cited authors)
Graham, M. A., Grasley, Z. C., & Rub, R.
complete list of authors
Graham, Michael A||Grasley, Zachary C||Rub, Rashid K Abu Al