Direct measurements of transient structures by means of time resolved x-ray diffraction
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abstract
The nanosecond x-ray pulses were used for time resolved x-ray diffraction to measure the transient structure of Pt (111) and GaAs (111) crystals caused by laser pulse heating. The use of charge coupled device (CCD) detector allowed for very high spatial resolution and simultaneous recording of the heated sample and unheated reference signal. This capability of the experimental system permitted the detection and direct measurement of very small lattice deformations induced by millijoules laser pulses.
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Laser Techniques for Condensed-Phase and Biological Systems