Direct measurements of transient structures by means of time resolved x-ray diffraction Conference Paper uri icon

abstract

  • The nanosecond x-ray pulses were used for time resolved x-ray diffraction to measure the transient structure of Pt (111) and GaAs (111) crystals caused by laser pulse heating. The use of charge coupled device (CCD) detector allowed for very high spatial resolution and simultaneous recording of the heated sample and unheated reference signal. This capability of the experimental system permitted the detection and direct measurement of very small lattice deformations induced by millijoules laser pulses.

name of conference

  • Laser Techniques for Condensed-Phase and Biological Systems

published proceedings

  • LASER TECHNIQUES FOR CONDENSED-PHASE AND BIOLOGICAL SYSTEMS

author list (cited authors)

  • Chen, P., Tomov, I. V., & Rentzepis, P. M.

citation count

  • 0

complete list of authors

  • Chen, P||Tomov, IV||Rentzepis, PM

editor list (cited editors)

  • Scherer, N. F., & Hicks, J. M.

publication date

  • April 1998