Fabrication and characterization of a monolithic thin-film edge emitter device with zinc-oxide-tungsten-based thin-film phosphor Academic Article

abstract

• The development of a monochromatic monolithic thin-film edge emitter (MT-FEE) device with zinc-oxide-tungsten-based thin-film phosphor was discussed. Different experimental structures were fabricated by varying the thickness of dielectric layer between 3 to 6 m with variable-edge geometrics. It was found that cathode was fabricated as a sandwich of Cr/C/Cr. Analysis shows that testing of devices demonstrated stable emission currents at voltages as low as 300 V with the emission of blue light.

authors

• Weichold, Mark

published proceedings

• JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

author list (cited authors)

• Bhatia, V., Karpov, L. K., & Weichold, M. H.

citation count

• 2

complete list of authors

• Bhatia, V||Karpov, LK||Weichold, MH

publication date

• January 2004

publisher

• American Vacuum Society  Publisher

published in

• Journal of Vacuum Science and Technology Part B: Nanotechnology and Microelectronics  Journal

Digital Object Identifier (DOI)

• 10.1116/1.1640400

start page

• 165

end page

• 170

volume

• 22

issue

• 1

URL

• http://dx.doi.org/10.1116/1.1640400