Improved microwave test fixture for brittle substrate materials Academic Article uri icon

abstract

  • A microwave test fixture has been designed and built to hold brittle substrate materials, such as GaAs, without inducing damage. The substrate pressure is adjustable and easily controlled by the use of compression springs. Tests have shown that the holder does not damage GaAs substrates, and produces repeatable and reliable measurements.

author list (cited authors)

  • McGregor, D. S., & Weichold, M. H.

citation count

  • 1

publication date

  • March 1989