Power supply noise control in pseudo functional test Conference Paper uri icon

name of conference

  • 2013 IEEE 31st VLSI Test Symposium (VTS)

published proceedings

  • 2013 IEEE 31st VLSI Test Symposium (VTS)

author list (cited authors)

  • Tengteng Zhang, .., & Walker, D.

citation count

  • 23

complete list of authors

  • Walker, Duncan M Hank

publication date

  • April 2013

publisher