Power Supply Noise Control in Pseudo Functional Test Conference Paper

name of conference

• 2013 IEEE 31st VLSI Test Symposium (VTS)

authors

• Walker, Duncan

published proceedings

• 2013 IEEE 31ST VLSI TEST SYMPOSIUM (VTS)

author list (cited authors)

• Zhang, T., & Walker, D.

citation count

• 24

complete list of authors

• Zhang, Tengteng||Walker, Duncan M Hank

publication date

• April 2013

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• n1093-0167ISSN  Journal

keywords

• Delay Test
• Power Supply Noise
• Pseudo Functional Test
• Test Generation

Digital Object Identifier (DOI)

• 10.1109/vts.2013.6548881

International Standard Book Number (ISBN) 13

• 978-1-4673-5542-1

start page

• 1

end page

• 6

URL

• http://dx.doi.org/10.1109/vts.2013.6548881