ULTRASONIC NONDESTRUCTIVE EVALUATION OF THIN (SUBWAVELENGTH) COATINGS Conference Paper

abstract

• An ultrasonic technique for the simultaneous measurement of the thickness and wavespeed of a thin coating on a thick substrate is developed. Transfer functions have been derived. A systematic analysis of the sensitivity of the transfer functions to the coating properties has been carried out. This technique is independent of the substrate thickness.

authors

• Kinra, Vikram

published proceedings

• ULTRASONICS INTERNATIONAL 93 - CONFERENCE PROCEEDINGS

author list (cited authors)

• KINRA, V. K., & ZHU, C. Y.

citation count

• 1

complete list of authors

• KINRA, VK||ZHU, CY

publication date

• December 1993

publisher

• Elsevier  Publisher

keywords

• Thickness And Wavespeed
• Thin Coatings
• Ultrasonic Nde

Digital Object Identifier (DOI)

• 10.1016/b978-0-7506-1877-9.50083-4

International Standard Book Number (ISBN) 10

• 0-750618-77-9

start page

• 331

end page

• 334

URL

• http://dx.doi.org/10.1016/b978-0-7506-1877-9.50083-4