Ultrasonic Nondestructive Evaluation of Thin (Sub-Wavelength) Coatings Conference Paper uri icon

abstract

  • An ultrasonic technique for the simultaneous measurement of the thickness and wavespeed of a thin coating on a thick substrate is developed. Transfer functions have been derived. A systematic analysis of the sensitivity of the transfer functions to the coating properties has been carried out. This technique is independent of the substrate thickness.

published proceedings

  • ULTRASONICS INTERNATIONAL 93 - CONFERENCE PROCEEDINGS

author list (cited authors)

  • KINRA, V. K., & ZHU, C.

complete list of authors

  • KINRA, Vikram K||ZHU, Changyi

publication date

  • January 1, 1993 11:11 AM