Low-frequency current noise in electrochromic devices Academic Article

abstract

• 1/f noise was observed in electrochromic (EC) devices capable of modulating their optical transmittance by an applied voltage. The device comprised nanoporous W oxide and Ni-V oxide films and an intervening polymer electrolyte between transparent conducting In2O3:Sn films backed by polyester foils. Current (I) 1/f noise was observed when the charged (colored) device was discharged via a resistor. The power spectral density Si at fixed frequency varied as SiI2. Continuous coloration/bleaching degraded the optical quality and homogeneity of the device and led to a concomitant increase of the 1/f noise intensity, thus indicating that 1/fnoise has the potential to serve as a quality measure for EC devices. 2008 IOP Publishing Ltd.

authors

• Kish, Laszlo

published proceedings

• SMART MATERIALS AND STRUCTURES

author list (cited authors)

• Smulko, J., Azens, A., Kish, L. B., & Granqvist, C. G.

citation count

• 4

complete list of authors

• Smulko, J||Azens, A||Kish, LB||Granqvist, CG

publication date

• April 2008

publisher

• IOP Publishing  Publisher

published in

• Smart Materials and Structures  Journal

keywords

• 34 Chemical Sciences
• 40 Engineering
• 4016 Materials Engineering

Digital Object Identifier (DOI)

• 10.1088/0964-1726/17/2/025005

start page

• 025005

end page

• 025005

volume

• 17

issue

• 2

URL

• http%3A%2F%2Fdx.doi.org%2F10.1088%2F0964-1726%2F17%2F2%2F025005