Levelized Low Cost Delay Test Compaction Considering IR-Drop Induced Power Supply Noise Conference Paper

abstract

• Power supply noise is very important in delay testing. Excessive noise can cause circuit delay increases that lead to test overkill. Test patterns that are too quiet can lead to test escapes. In this work, we introduce a realistic low cost delay test compaction flow that guardbands circuit delay during test using a sequence of estimation metrics. Significant reductions in CPU time are demonstrated over prior work. 2011 IEEE.

name of conference

• 29th VLSI Test Symposium

authors

• Walker, Duncan

published proceedings

• 2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS)

author list (cited authors)

• Jiang, Z., Wang, Z., Wang, J., & Walker, D.

citation count

• 7

complete list of authors

• Jiang, Zhongwei||Wang, Zheng||Wang, Jing||Walker, DMH

publication date

• May 2011

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• n1093-0167ISSN  Journal

keywords

• Compaction
• Delay Test
• Dynamic Compaction
• Ir Drop
• Power Supply Noise
• Static

Digital Object Identifier (DOI)

• 10.1109/vts.2011.5783754

International Standard Book Number (ISBN) 13

• 9781612846552

start page

• 52

end page

• 57

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fvts.2011.5783754