Levelized Low Cost Delay Test Compaction Considering IR-Drop Induced Power Supply Noise Conference Paper uri icon

abstract

  • Power supply noise is very important in delay testing. Excessive noise can cause circuit delay increases that lead to test overkill. Test patterns that are too quiet can lead to test escapes. In this work, we introduce a realistic low cost delay test compaction flow that guardbands circuit delay during test using a sequence of estimation metrics. Significant reductions in CPU time are demonstrated over prior work. © 2011 IEEE.

author list (cited authors)

  • Jiang, Z., Wang, Z., Wang, J., & Walker, D.

citation count

  • 7

publication date

  • May 2011

publisher